What is the purpose of citing related art in patent applications?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-10 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. The purpose of citing related art in patent applications is to provide the examiner with a comprehensive understanding of the state of the art relevant to the claimed invention. According to MPEP 707.05(b) , applicants are encouraged to cite related art and information that may be helpful in the examination process. Specifically, the MPEP states: ‘The citation of related art by applicants in accordance with MPEP § 609 and § 708.02 is encouraged.’ This practice helps ensure a thorough examination and can potentially expedite the patent prosecution process by providing the examiner with relevant information upfront. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Examiner Must Thoroughly Study and Investigate Patent Applications MPEP 707 Required Examiners Can Require Applicants to Submit Necessary Info MPEP 707.05(b) Examiners Must Conduct Independent Prior Art Searches MPEP 707.05(b) Permitted Information Not Supplied with Office Action MPEP 707.05(b) Guidelines for Submitting Prior Art MPEP 707.05(b) Examiners Must Conduct Independent Searches MPEP 707.05(b) Permitted Applicant-Supplied Prior Art Not Included in Office Action MPEP 707.05(b) Examiner Must Thoroughly Study and Investigate Prior Art During Reexamination MPEP 707 Required Comprehensive Examination Required for Patentability and Compliance MPEP 707 Required International-Type Search Required for National Applications Filed After June 1, 1978 MPEP 707 Required Other Related FAQs 5 FAQs Collapse How does the USPTO handle additional information submitted by applicants in response to examiner requests? How does the USPTO handle prior art submitted by applicants? How should applicants cite information fr...