What electronic resources does STIC provide for patent examiners?
The Scientific and Technical Information Center (STIC) offers a wide range of electronic resources to support patent examiners in their work:
- Online Databases: STIC provides access to numerous scientific and technical databases covering various fields of technology.
- Electronic Journals: Examiners can access a vast collection of electronic journals through STIC’s subscriptions.
- E-Books: STIC maintains a library of electronic books relevant to patent examination.
- Search Tools: STIC offers specialized search tools and interfaces for efficient prior art searching.
The MPEP 901.06(a) states: “Online databases available to examiners include numerous technical and scientific databases and links to external databases.” This emphasizes the importance of electronic resources in modern patent examination.
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