What electronic resources does STIC provide for patent examiners?

Source: FAQ (MPEP-Based)BlueIron Update: 2024-09-27

This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice.

The Scientific and Technical Information Center (STIC) offers a wide range of electronic resources to support patent examiners in their work:

  • Online Databases: STIC provides access to numerous scientific and technical databases covering various fields of technology.
  • Electronic Journals: Examiners can access a vast collection of electronic journals through STIC’s subscriptions.
  • E-Books: STIC maintains a library of electronic books relevant to patent examination.
  • Search Tools: STIC offers specialized search tools and interfaces for efficient prior art searching.

The MPEP 901.06(a) states: “Online databases available to examiners include numerous technical and scientific databases and links to external databases.” This emphasizes the importance of electronic resources in modern patent examination.

Tags: e-journals, electronic resources, Online Databases, patent examination, stic services