How can patent examiners directly access foreign patent information?
Patent examiners at the USPTO have multiple options for directly accessing foreign patent information. According to MPEP 901.07: Directly search WPI in-house Access INPADOC database Use both WPI and INPADOC Request foreign patent searches through the Scientific and Technical Information Center (STIC) The MPEP states: Patent examiners may directly search WPI in-house or INPADOC or…
Read MoreWhat translation services does STIC provide for foreign language documents?
STIC offers comprehensive translation services for foreign language documents through its Translations Service Center. These services include: Oral translations for major European languages and Japanese Written translations from virtually all foreign languages into English Full translations upon request Maintenance of a database of previously completed document translations According to MPEP 901.06(a): “Examiners may consult the…
Read MoreWhat specialized services does STIC offer for examiners?
The Scientific and Technical Information Center (STIC) offers several specialized services to support patent examiners: Foreign patent document retrieval: STIC can obtain copies of foreign patent documents not available in USPTO databases. Translations: STIC provides translations of foreign language patents and non-patent literature. Scientific and Technical Literature: STIC maintains extensive collections of scientific and technical…
Read MoreWhat services does STIC offer for foreign patent documents?
STIC offers comprehensive services for foreign patent documents through its Foreign Patents Service Center. These services include: Online patent family searches Identification of English-language or preferred-language equivalents Determination of priority dates and publication dates Searches by inventor name or abstract number Patent family and bibliographic document retrieval searches Foreign classification information According to MPEP 901.06(a):…
Read MoreWhat electronic resources does STIC provide for patent examiners?
The Scientific and Technical Information Center (STIC) offers a wide range of electronic resources to support patent examiners in their work: Online Databases: STIC provides access to numerous scientific and technical databases covering various fields of technology. Electronic Journals: Examiners can access a vast collection of electronic journals through STIC’s subscriptions. E-Books: STIC maintains a…
Read MoreHow does STIC assist patent examiners with prior art searches?
STIC provides crucial assistance to patent examiners for prior art searches through various means: STIC staff in Electronic Information Centers (EICs) perform prior art searches using commercial databases (CDBs) and subscription resources. Examiners can submit requests for prior art searches using the Text/Regular Form on the STIC NPL website. STIC offers access to non-patent literature…
Read MoreHow does STIC assist with foreign language patent documents?
The Scientific and Technical Information Center (STIC) provides crucial assistance with foreign language patent documents in several ways: Document Retrieval: STIC can obtain copies of foreign patent documents that are not readily available in USPTO databases. Translation Services: STIC offers translation services for foreign language patents, enabling examiners to understand and analyze non-English patent documents.…
Read MoreWhat is the relationship between MPEP 901.06(b) and MPEP 901.06(a)?
MPEP 901.06(b) directly references MPEP 901.06(a) for information on borrowed publications. The section states: “See MPEP § 901.06(a) , STIC Services – Interlibrary Loans.” This indicates that MPEP 901.06(a) contains more detailed information about STIC Services and interlibrary loans, which are the primary means of accessing borrowed publications. Essentially, 901.06(b) serves as a pointer to…
Read MoreHow can patent examiners request materials not available in STIC?
Patent examiners can request materials not available in STIC through the Interlibrary Loan service. The process is as follows: Submit a request to the STIC facility in the examiner’s Technology Center (TC) Use the electronic form available on the STIC NPL website The MPEP 901.06(a) states: “When needed for official business purposes, STIC will borrow…
Read MoreWhat are “Borrowed Publications” in the context of patent examination?
“Borrowed Publications” refer to publications that are not permanently available in the USPTO’s Scientific and Technical Information Center (STIC) but can be obtained through interlibrary loan services. The Manual of Patent Examining Procedure (MPEP) states in section 901.06(b): “See MPEP § 901.06(a) , STIC Services – Interlibrary Loans.” This indicates that examiners and other USPTO…
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