What electronic resources does STIC provide for patent examiners?
The Scientific and Technical Information Center (STIC) offers a wide range of electronic resources to support patent examiners in their work: Online Databases: STIC provides access to numerous scientific and technical databases covering various fields of technology. Electronic Journals: Examiners can access a vast collection of electronic journals through STIC’s subscriptions. E-Books: STIC maintains a…
Read MoreHow can patent examiners access non-patent literature through STIC?
Patent examiners can access non-patent literature through the Scientific and Technical Information Center (STIC) in several ways: Electronic Resources: STIC provides access to e-books, e-journals, and databases via the STIC NPL website. Print Collections: Each Electronic Information Center (EIC) has a tailored print collection for its Technology Center. Online Catalog: Examiners can use the STIC…
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