What are the main sources of foreign patent documents for USPTO examiners?

Question

Accepted Answer

Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. USPTO examiners have access to various sources of foreign patent documents, including: Digests of foreign patent documents Abstracts of foreign patent documents Photographic and photostatic copies of entire foreign patent documents The MPEP states: “ In general, these foreign patent documents provide a source of technological teachings and prior art accessible to the examiner. ” (Source: MPEP 901.05 ) Examiners can access these documents through specialized databases and search tools provided by the USPTO, ensuring comprehensive prior art searches. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Examiner Requires No Proof of Foreign Patent Dates MPEP 901.05 Required Prior Art Documents for Pre-AIA Rejections MPEP 901.05 Citation of Foreign Patents Must Be Confirmed MPEP 901.05 Recommended Requirement for Citing Foreign Patent Documents MPEP 901.05 Foreign Patent Issued Before U.S. Reference Filing Date MPEP 901.05 Search for Foreign Patents Can Be Laborious MPEP 901.05 Access to Chemical Abstracts via STIC MPEP 901.05 Access to International Patent File Histories Required MPEP 901.05 Examiners Can Use Global Dossier Public Access MPEP 901.05 Permitted Earlier Application May Be Prior Art to Later One If Published MPEP 901.05 Permitted Other Related FAQs 5 FAQs Collapse How are foreign patent documents classified in the USPTO? What is the significance of the International Patent Classification (IPC) in USPTO examinations? What is the Scientific and Technical Information Center (STIC) in relation to foreign patent documents? How can examiners access foreign patent documents at the USPTO? How do USPTO examiners cite foreign patent documents?