What is a Continuation-In-Part (CIP) application?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-30 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. A Continuation-In-Part (CIP) application is a type of patent application that contains a portion or all of the disclosure of an earlier application and adds matter not disclosed in the earlier parent application. The new matter in a CIP application can be claimed, but it may affect the effective filing date of certain claims. According to MPEP 2133.01 , “When applicant files a continuation-in-part application, none of whose claims are supported by the parent application under pre-AIA 35 U.S.C. 112, first paragraph, the effective filing date is the filing date of the child CIP.” Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Child CIP Effective Date When No Parent Support MPEP 2133.01 Effective Filing Date Determined Claim-by-Claim MPEP 2133.01 Claims Must Be Fully Supported by Parent Application MPEP 2133.01 Claims Must Be Supported by Parent Application MPEP 2133.01 Requirement for Novelty Under Pre-AIA 35 U.S.C. 102(b) MPEP 2133 Required Filing Date Not Affected by Electronic Filing MPEP 2133 Claim Support from CIP Requires Earlier Effective Date MPEP 2133.01 Required Prior Art Disclosing Invention Before Filing Date Bars Patent Issuance for CIP MPEP 2133.01 Disclosure Before Filing Bars Patent MPEP 2133 Obvious Variant Prior Art Bars Patentability MPEP 2133 Other Related FAQs 5 FAQs Collapse How does the AIA (America Invents Act) affect the treatment of CIP applications? How do examiners determine which claims in a CIP application are entitled to the parent application&#8217;s filing date? How is the effective filing date determined for claims in a CIP application? How does the &#8220;effective filing date&#8221; affect CIP applications in patent examination...