What is the Scientific and Technical Information Center (STIC) in relation to foreign patent documents?

Question

Accepted Answer

Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. The Scientific and Technical Information Center (STIC) plays a crucial role in managing foreign patent documents at the USPTO. According to MPEP 901.05 : “The Scientific and Technical Information Center (STIC) maintains a collection of foreign patents and foreign language technical literature.” STIC’s responsibilities include: Maintaining a comprehensive collection of foreign patents Providing access to foreign language technical literature Assisting examiners in searching and retrieving relevant foreign patent documents Supporting the USPTO’s prior art search capabilities Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Examiner Requires No Proof of Foreign Patent Dates MPEP 901.05 Required Citation of Foreign Patents Must Be Confirmed MPEP 901.05 Recommended Requirement for Citing Foreign Patent Documents MPEP 901.05 Access to Chemical Abstracts via STIC MPEP 901.05 Foreign Language Specification as Reference MPEP 901.05 Required Foreign Patent Issued Before U.S. Reference Filing Date MPEP 901.05 Search for Foreign Patents Can Be Laborious MPEP 901.05 Access to International Patent File Histories Required MPEP 901.05 Earlier Application May Be Prior Art to Later One If Published MPEP 901.05 Permitted Prior Art Documents for Pre-AIA Rejections MPEP 901.05 Other Related FAQs 5 FAQs Collapse How are foreign patent documents classified in the USPTO? What are the main sources of foreign patent documents for USPTO examiners? What is the significance of the International Patent Classification (IPC) in USPTO examinations? How can examiners access foreign patent documents at the USPTO? How do USPTO examiners cite foreign patent documents?