What is the purpose of reissue review in patent examination?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. Reissue review serves two main purposes in patent examination: To ensure that practices and procedures unique to reissue applications are properly carried out. To conduct a patentability review in a sample of reissue applications. As stated in MPEP 1456 : “ The review by the Office of the TC TQASs is made to check that practice and procedure unique to reissue has been carried out for the reissue application. In addition, a patentability review is made in a sample of reissue applications by the TC TQAS in the manner previously carried out by the former Office of Patent Quality Review. “ Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Patentability Review for Sample Reissue Applications MPEP 1456 TQAS Must Set Reissue Application Status Flag Before Docketing MPEP 1456 Required TQAS Must Set Reissue Application Flag Before Examination MPEP 1456 Permitted TC TQAS Must Verify Reissue Procedures MPEP 1456 Training Quality Assurance Specialist Reviews Reissue Applications MPEP 1456 TQAS Must Set Status Flags for Reissue Applications MPEP 1456 Required TQAS Must Remove Status Flag Before Allowance MPEP 1456 Required Notice of Reissue Application Must Be Published Before Examination MPEP 1430 Recommended Notice of Reissue Application Must Be Published Before Examination MPEP 1441.01 Recommended Reissue Application Filing Requirements Not Announced Until Compliance MPEP 1430 Required Other Related FAQs 5 FAQs Collapse What is the role of the Office of Patent Legal Administration (OPLA) in the reissue review process? What is the purpose of the reissue pending form paragraph in MPEP 1456? What happens if a reissue application is not ready for publication as a patent at the ...