How can examiners access foreign patent documents at the USPTO?

Examiners at the USPTO have several methods to access foreign patent documents:

1. Scientific and Technical Information Center (STIC): As mentioned in MPEP 901.05, “The Scientific and Technical Information Center (STIC) maintains a collection of foreign patents and foreign language technical literature.”
2. USPTO’s Search Tools: Examiners can use various search tools provided by the USPTO to access foreign patent documents.
3. Databases: The USPTO provides access to international patent databases, such as WIPO’s PATENTSCOPE and the European Patent Office’s Espacenet.
4. Translations: For non-English documents, STIC can provide translations or assistance in understanding the content.

Examiners are encouraged to utilize these resources to ensure a comprehensive prior art search, including relevant foreign patent documents.

To learn more:

• Foreign patents
• USPTO resources
• Patent examination