How are foreign patent documents classified in the USPTO?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. Foreign patent documents are classified in the USPTO according to the following system: Documents published by the European Patent Office (EPO) or the World Intellectual Property Organization (WIPO) are classified only in the International Patent Classification (IPC) system. Other foreign patent documents may be classified in the IPC, the United States Patent Classification (USPC) system, or both systems. The MPEP states: “ All foreign patents and published applications that are included in the examiner’s search files are available to the examiner. ” (Source: MPEP 901.05 ) Examiners can access these documents through various databases and search tools provided by the USPTO. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Foreign Patents Available to U.S. Examiners MPEP 901.05 Requirement for Citing Foreign Patent Documents MPEP 901.05 Most Current Patent Office Practice Not Applicable to Older Documents MPEP 901.05 Published Documents Are References Under Pre-AIA 35 U.S.C. 102 MPEP 901.05 Examiners Can Use Global Dossier Public Access MPEP 901.05 Permitted Specification Can Be Inspected at Patent Office After Notice MPEP 901.05 Permitted Foreign Patent Issued Before U.S. Reference Filing Date MPEP 901.05 Search for Foreign Patents Can Be Laborious MPEP 901.05 Access to International Patent File Histories Required MPEP 901.05 Examiner Requires No Proof of Foreign Patent Dates MPEP 901.05 Required Other Related FAQs 5 FAQs Collapse What are the main sources of foreign patent documents for USPTO examiners? What is the significance of the International Patent Classification (IPC) in USPTO examinations? What is the Scientific and Technical Information Center (STIC) i...