When is it necessary to inspect previously abandoned application files or granted patents?
Inspection of previously abandoned application files or granted patents becomes necessary in certain situations during patent examination: When examining a reissue application During a reexamination proceeding When evaluating potential prior art To understand the prosecution history of related applications MPEP 901.01(a) states: “In the examination of an application, it is sometimes necessary to inspect the…
Read MoreHow can the public access and view reissue application files?
The public can access and view reissue application files through the USPTO’s Patent Center. MPEP 1470 provides the following information: “IFW reissue application files are open to inspection by the general public by way of Patent Center via the USPTO Internet site. In viewing the images of the files, members of the public will be…
Read More