What additional classification systems should patent examiners consider besides CPC?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. While the Cooperative Patent Classification (CPC) system is the primary search tool, patent examiners should also consider other classification systems. The MPEP 904.02(a) mentions: “In addition to CPC, there are some other classification tools available such as the International Patent Classification (IPC) and the United States Patent Classification (USPC) system.” Examiners should utilize these additional systems to ensure a comprehensive search: International Patent Classification (IPC) United States Patent Classification (USPC) Any other relevant specialized classification systems Using multiple classification systems can help identify relevant prior art that might be missed by relying solely on CPC. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Prioritize Search for Relevant Prior Art MPEP 904.02(a) Recommended Examiner Must Consider Prior Art from Parent Application MPEP 904 Required Review of Cited Prior Art from Parent Application Required MPEP 904 Recommended Examiner Must Identify All Prior Art Sources MPEP 904 Required Consider All Likely Prior Art Areas Thoroughly MPEP 904.02(a) Recommended Examiners Must Cite Relevant Prior Art MPEP 1843.01 Parent Applications Must Be Reviewed for Prior Art MPEP 904 Required Examiner Must Review File Wrapper History and PTAB Post-Grant Proceedings MPEP 904 Required Documents Cited in International Search Report Must Be Considered MPEP 904 First Search Should Cover Invention as Claimed MPEP 904 Recommended Other Related FAQs 5 FAQs Collapse How should patent examiners approach classification searching? What classification systems are used in patent searches? What is a classified search in patent examination? How is...