What is the Scientific and Technical Information Center (STIC) and its role in patent examination?
The Scientific and Technical Information Center (STIC) is a crucial resource for patent examiners at the USPTO. According to MPEP 901.06(a), STIC’s main functions include: Maintaining Electronic Information Centers (EICs) in each Technology Center Assisting patent examiners with prior art searches Providing document delivery services Offering access to foreign patent copies and translations Providing access…
Read MoreWhat is the purpose of the nonpatent literature collection in patent examination?
The nonpatent literature collection serves a crucial purpose in patent examination, as outlined in MPEP 901.06: “The collection of nonpatent publications in the Scientific and Technical Information Center (STIC) is for use by examiners in searching the prior art. These publications are found largely in the technology collection.” The primary purposes of this collection are:…
Read MoreWhat search tools are available to patent examiners?
Patent examiners have access to a wide variety of manual and automated search tools. These tools cover three main reference sources: Domestic patents (including patent application publications) Foreign patent documents Nonpatent literature (NPL) The MPEP 904.02 states, “Examiners are provided access to a wide variety of both manual and automated search tools. Choice of search…
Read MoreWhat is the procedure for providing copies of references at the time of allowance?
The MPEP 707.05(a) outlines the procedure for providing copies of references at the time of allowance: Copies of foreign patent documents and nonpatent literature (NPL) which are cited by the examiner at the time of allowance will be furnished to applicant with the Office action and be retained in the file wrapper. This will apply…
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