What is the statutory basis for ex parte reexamination of patents?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-30 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. The statutory basis for ex parte reexamination of patents was established on July 1, 1981, through sections 301-307 of title 35, United States Code, added by Public Law 96-517. The MPEP states: “Statutory basis for citation of prior art patents or printed publications in patent files and ex parte reexamination of patents became available on July 1, 1981, as a result of new sections 301-307 of title 35, United States Code, which were added by Public Law 96-517, enacted on December 12, 1980.” This legislation provided a mechanism for citing prior art and requesting reexamination of granted patents. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse New Sections for Prior Art Citation and Ex Parte Reexamination Available on July 1, 1981 MPEP 2201 Rules for Ex Parte Reexamination of Patents MPEP 2201 Permitted Guide for Processing Prior Art Citations and Ex Parte Reexamination Requests MPEP 2201 Statements of Patent Owner Regarding Claim Scope Required in Proceedings MPEP 2201 Permitted Estoppel for Filing Ex Parte Reexamination After Final Decision in IPR MPEP 2201 Permitted Reexamination Uses Examining Prior Art Regime MPEP 2201 Request for Ex Parte Reexamination of Issued Patent MPEP 2003.01 Permitted Optional Inter Partes Reexamination Added by AIPA MPEP 2201 First-Inventor-to-File Prior Art Applies Generally MPEP 2201 Supplemental Examination Proceeding for Patent Reexamination MPEP 2201 Other Related FAQs 5 FAQs Collapse How did the America Invents Act (AIA) affect ex parte reexamination? What happened to inter partes reexamination under the America Invents Act? How does the prior art regime affect reexamination proceedings? What is supplemental examination and h...