How can patent examiners directly access foreign patent information?

Source: FAQ (MPEP-Based)BlueIron Update: 2024-09-27

This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice.

Patent examiners at the USPTO have multiple options for directly accessing foreign patent information. According to MPEP 901.07:

  • Directly search WPI in-house
  • Access INPADOC database
  • Use both WPI and INPADOC
  • Request foreign patent searches through the Scientific and Technical Information Center (STIC)

The MPEP states: Patent examiners may directly search WPI in-house or INPADOC or both. Examiners may also request foreign patent searches through STIC.

For more information on STIC services, examiners are directed to MPEP § 901.06(a), paragraph IV.

Tags: foreign patent search, patent examination, stic services, USPTO Resources