How can examiners access foreign patent documents at the USPTO?

This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice.

Examiners at the USPTO have several methods to access foreign patent documents:

1. Scientific and Technical Information Center (STIC): As mentioned in MPEP 901.05, “The Scientific and Technical Information Center (STIC) maintains a collection of foreign patents and foreign language technical literature.”
2. USPTO’s Search Tools: Examiners can use various search tools provided by the USPTO to access foreign patent documents.
3. Databases: The USPTO provides access to international patent databases, such as WIPO’s PATENTSCOPE and the European Patent Office’s Espacenet.
4. Translations: For non-English documents, STIC can provide translations or assistance in understanding the content.

Examiners are encouraged to utilize these resources to ensure a comprehensive prior art search, including relevant foreign patent documents.