How can patent examiners access non-patent literature through STIC?

Patent examiners can access non-patent literature through the Scientific and Technical Information Center (STIC) in several ways:

• Electronic Resources: STIC provides access to e-books, e-journals, and databases via the STIC NPL website.
• Print Collections: Each Electronic Information Center (EIC) has a tailored print collection for its Technology Center.
• Online Catalog: Examiners can use the STIC online catalog to locate materials, including e-books, e-journals, and print resources.
• Reference Services: STIC staff can assist examiners in finding information in electronic and print collections.
• Online Searches: STIC staff can perform prior art and bibliographic searches using commercial databases and subscription resources.

According to MPEP 901.06(a), “Examiners may use the Department of Commerce Libraries as well as other Federal Government libraries in the area.” STIC staff can also guide examiners on accessing these additional resources.

To learn more:

• non-patent literature
• STIC
• patent examination
• prior art search
• electronic resources