What types of resources does STIC provide for patent examiners?
STIC provides a wide range of resources for patent examiners, including:
- Electronic and print books
- Periodicals
- Foreign patent documents
- Reference works (encyclopedias, dictionaries, handbooks)
- Online databases and subscription resources
- Non-patent literature
According to MPEP 901.06(a):
“Technical literature, foreign patent documents, and reference and online search services available in STIC are all important resources for the patent examiner to utilize. These resources provide material which must be known or searched to determine whether claims of applications are directly anticipated and, therefore, unpatentable under the provisions of 35 U.S.C. 102.“
These resources help examiners assess the novelty and non-obviousness of patent applications by providing access to the most current and comprehensive technical information.
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