What is the Scientific and Technical Information Center (STIC) and its role in patent examination?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. The Scientific and Technical Information Center (STIC) is a crucial resource for patent examiners at the USPTO. According to MPEP 901.06(a) , STIC’s main functions include: Maintaining Electronic Information Centers (EICs) in each Technology Center Assisting patent examiners with prior art searches Providing document delivery services Offering access to foreign patent copies and translations Providing access to non-patent literature in electronic and print formats STIC’s resources are essential for examiners to determine whether claims in patent applications are anticipated by prior art under 35 U.S.C. 102 or obvious under 35 U.S.C. 103 . Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Scientific and Technical Information Center Database Coverage MPEP 901.06(a) Permitted Access to Non-Patent Literature Requires Expert Knowledge MPEP 901.06(a) Examiners Can Submit Prior Art Search Requests MPEP 901.06(a) Permitted Foreign Patent Request Form Required for Patent Family Searches MPEP 901.06(a) Permitted Director Must Maintain Library for Patent Officers MPEP 901.06(a) Required Access to Electronic Resources from USTPO Network MPEP 901.06(a) In-House Sequence Search for Examiners MPEP 901.06(a) Examiners Can Perform Foreign Patent Searches After Training MPEP 901.06(a) Permitted Training Provided for Using Foreign Patent Collections MPEP 901.06(a) Public Can Order Foreign Patent Documents MPEP 901.06(a) Permitted Other Related FAQs 5 FAQs Collapse What are the foreign patent document services provided by STIC? What is the importance of STIC resources in determining patentability? How can patent examiners access STIC&#8217;s electronic resources? How can patent exami...