How does 35 U.S.C. 112(f) relate to the doctrine of equivalents?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-29 10 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. 35 U.S.C. 112(f) (formerly 35 U.S.C. 112, sixth paragraph) has a specific relationship to the doctrine of equivalents. MPEP 2186 explains: “35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, permit means- (or step-) plus-function limitations in claims to combinations, ‘with the proviso that application of the broad literal language of such claims must be limited to only those means that are ‘equivalent’ to the actual means shown in the patent specification. This is an application of the doctrine of equivalents in a restrictive role, narrowing the application of broad literal claim elements.'” In essence, 35 U.S.C. 112(f) applies the doctrine of equivalents in a restrictive manner to means-plus-function claim limitations, limiting their scope to equivalents of the structures disclosed in the specification. Related Rules from the Manual of Patent Examining Procedure 10 rules Collapse Means-Plus-Function Claims Must Be Equivalent to Specified Means MPEP 2186 Required Means-Plus-Function Claims Must Be Equivalent to Specified Means MPEP 2186 Infringement Under Doctrine of Equivalents Must Match Function, Way, and Result MPEP 2186 Equivalents Not to Influence Means-Plus-Function Determination MPEP 2186 Recommended Infringement by Equivalent Elements MPEP 2186 Permitted Infringement by Equivalent Elements MPEP 2186 Infringement by Equivalent Elements MPEP 2186 Role of Elements in Determining Equivalence MPEP 2186 Equivalence Determination for Infringement MPEP 2186 Pending Claims Must Be Interpreted Broadly MPEP 2111 Required Other Related FAQs 5 FAQs Collapse How is the doctrine of equivalents applied in patent infringement cases? How does the doctrine of equivalents affect patent examin...