How can the public access and view reissue application files?

The public can access and view reissue application files through the USPTO’s Patent Center. MPEP 1470 provides the following information:

“IFW reissue application files are open to inspection by the general public by way of Patent Center via the USPTO Internet site. In viewing the images of the files, members of the public will be able to view the entire content of the reissue application file history.“

To access Patent Center, visit the USPTO website and navigate to the Patent Center tool.

To learn more:

• reissue applications
• public access
• Patent Center
• USPTO
• file inspection