How can patent examiners directly access foreign patent information?

Patent examiners at the USPTO have multiple options for directly accessing foreign patent information. According to MPEP 901.07:

• Directly search WPI in-house
• Access INPADOC database
• Use both WPI and INPADOC
• Request foreign patent searches through the Scientific and Technical Information Center (STIC)

The MPEP states: Patent examiners may directly search WPI in-house or INPADOC or both. Examiners may also request foreign patent searches through STIC.

For more information on STIC services, examiners are directed to MPEP § 901.06(a), paragraph IV.

To learn more:

• foreign patent search
• patent examination
• USPTO resources
• STIC services