What electronic resources does STIC provide for patent examiners?

The Scientific and Technical Information Center (STIC) offers a wide range of electronic resources to support patent examiners in their work:

• Online Databases: STIC provides access to numerous scientific and technical databases covering various fields of technology.
• Electronic Journals: Examiners can access a vast collection of electronic journals through STIC’s subscriptions.
• E-Books: STIC maintains a library of electronic books relevant to patent examination.
• Search Tools: STIC offers specialized search tools and interfaces for efficient prior art searching.

The MPEP 901.06(a) states: “Online databases available to examiners include numerous technical and scientific databases and links to external databases.” This emphasizes the importance of electronic resources in modern patent examination.

To learn more:

• electronic resources
• STIC services
• online databases
• e-journals
• patent examination