How can the public access reissue application files?
This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice.
The public can access reissue application files through the USPTO’s Patent Center. MPEP 1430 states: “IFW reissue application files are open to inspection by the general public by way of Patent Center via the USPTO Internet site. In viewing the images of the files, members of the public will be able to view the entire content of the reissue application file history.” To access Patent Center, follow these steps:
- Go to the USPTO website at www.uspto.gov
- Navigate to the Patent Center
- Search for the reissue application using the appropriate identifiers
This system allows for transparent and easy access to reissue application files, enabling the public to review the complete file history.