How can patent examiners access STIC’s electronic resources?

Patent examiners can access STIC’s electronic resources through various methods:

1. Via the STIC NPL website, accessible through the Patent Examiner’s Toolkit
2. Through the STIC online catalog, which contains records of all materials held by STIC
3. By using commercial databases (CDBs) and subscription resources

The MPEP 901.06(a) states:

“The primary vehicle for locating e-books, e-journals, database and subscription resources, books in print and other materials is the STIC online catalog. The online catalog contains a record of all materials held by the STIC collections, including location, call number, and availability. Examiners can access the online catalog from their desktops via the Patent Examiner’s Toolkit or via the STIC NPL website.“

Examiners can also request assistance from STIC staff for accessing and searching these resources effectively.

To learn more:

• STIC Resources
• Electronic Access
• Patent Examiner Tools
• Online Catalog