What is the purpose of the Cooperative Patent Classification (CPC) system in patent examination?

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Source: FAQ (MPEP-Based) BlueIron Update: 2024-09-27 8 Rules 5 Related FAQs This page is an FAQ based on guidance from the Manual of Patent Examining Procedure. It is provided as guidance, with links to the ground truth sources. This is information only: it is not legal advice. The Cooperative Patent Classification (CPC) system serves a crucial purpose in patent examination. According to MPEP 909.01(a) : “ The CPC system is a classification system jointly developed by the European Patent Office (EPO) and the USPTO. The CPC system is based on the International Patent Classification (IPC) system and incorporates additional subdivisions to provide more detailed classifications.” The CPC system aims to: Provide a more detailed and precise classification of patent documents Facilitate more efficient prior art searches Enhance harmonization between the USPTO and EPO classification practices Improve the quality and consistency of patent examination across different patent offices Related Rules from the Manual of Patent Examining Procedure 8 rules Collapse Application Must Be Fully Classified on Receipt MPEP 909.01(b) Required Classifications Required for Examiner Assignment MPEP 909.01(b) Permitted Provisional Applications Not Classified or Assigned MPEP 909.01(b) Automated Routing for Examiner Assignment MPEP 909.01(a) Examiner Can Submit Classification Challenge for Improper C* Designations MPEP 909.01(a) Permitted No Longer Need to Provide Individual Personal Info for Security Clearance MPEP 120 Security Markings on Patent Drawings MPEP 121 Permitted Security Markings on Patent Drawings Must Be Outside Illustrations and Removed Upon Declassification MPEP 121 Other Related FAQs 5 FAQs Collapse What are C* designations in patent application classification? Can CPC symbols be changed during the patent examination process? Can CPC classification for a patent application change during examination? How does CPC classification affect the examination of new patent applications?...